Impedance parameters

Results: 46



#Item
21Accurate Characteristic Impedance Measurement on Silicon Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boul

Accurate Characteristic Impedance Measurement on Silicon Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boul

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Source URL: www.nist.gov

Language: English - Date: 2010-07-20 13:22:52
22MEASUREMENT  Improved Measurement and Analysis Yields Cost-Effective Standby Battery Monitoring Monitoring of standby battery parameters must be comprehensive

MEASUREMENT Improved Measurement and Analysis Yields Cost-Effective Standby Battery Monitoring Monitoring of standby battery parameters must be comprehensive

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Source URL: www.lem.com

Language: English - Date: 2010-03-18 05:02:41
23Characteristic-Impedance Measurement Error on Lossy Substrates Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dyla

Characteristic-Impedance Measurement Error on Lossy Substrates Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dyla

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Source URL: www.eeel.nist.gov

Language: English - Date: 2001-07-02 17:51:12
24Wideband Frequency-Domain Characterization of High-Impedance Probes Uwe Arz, Howard C. Reader1, Pavel Kabos, Dylan F. Williams National Institute of Standards and Technology 325 Broadway, Boulder, CO 80305, USA

Wideband Frequency-Domain Characterization of High-Impedance Probes Uwe Arz, Howard C. Reader1, Pavel Kabos, Dylan F. Williams National Institute of Standards and Technology 325 Broadway, Boulder, CO 80305, USA

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Source URL: www.eeel.nist.gov

Language: English - Date: 2002-02-13 12:51:24
25Comments on “Conversions Between S, Z, Y, h, ABCD, and T Parameters which are Valid for Complex Source and Load Impedances” Dylan F. Williams, IEEE Senior Member and Roger B. Marks, IEEE Senior Member National Instit

Comments on “Conversions Between S, Z, Y, h, ABCD, and T Parameters which are Valid for Complex Source and Load Impedances” Dylan F. Williams, IEEE Senior Member and Roger B. Marks, IEEE Senior Member National Instit

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Source URL: www.eeel.nist.gov

Language: English - Date: 1998-03-15 16:38:28
26Lumped-Element Impedance Standards Dylan F. Williams and David K. Walker National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boulde

Lumped-Element Impedance Standards Dylan F. Williams and David K. Walker National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boulde

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Source URL: www.eeel.nist.gov

Language: English - Date: 1998-03-15 16:38:52
27Thermal Noise in Lossy Waveguides Dylan F. Williams, Senior Member, IEEE National Institute of Standards and Technology 325 Broadway, Boulder, CO[removed]3138; [removed]FAX)

Thermal Noise in Lossy Waveguides Dylan F. Williams, Senior Member, IEEE National Institute of Standards and Technology 325 Broadway, Boulder, CO[removed]3138; [removed]FAX)

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Source URL: www.eeel.nist.gov

Language: English - Date: 1998-03-15 16:38:48
28Line-Reflect-Match Calibrations with Nonideal Microstrip Standards1 Dylan F. Williams, Senior Member, IEEE National Institute of Standards and Technology 325 Broadway, Boulder, CO[removed]Jerry B. Schappacher, Member, IEEE

Line-Reflect-Match Calibrations with Nonideal Microstrip Standards1 Dylan F. Williams, Senior Member, IEEE National Institute of Standards and Technology 325 Broadway, Boulder, CO[removed]Jerry B. Schappacher, Member, IEEE

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Source URL: www.eeel.nist.gov

Language: English - Date: 1998-03-15 16:38:38
29Summary of PTPAC Consensus to Date and Identification of Outstanding Issues Daryll Joyner, Program Adm. Bureau of Watershed Management Phone[removed]

Summary of PTPAC Consensus to Date and Identification of Outstanding Issues Daryll Joyner, Program Adm. Bureau of Watershed Management Phone[removed]

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Source URL: www.dep.state.fl.us

Language: English - Date: 2014-02-25 09:42:21
30Accurate Characteristic Impedance Measurement on Silicon Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boul

Accurate Characteristic Impedance Measurement on Silicon Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boul

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Source URL: www.nist.gov

Language: English - Date: 2010-07-20 13:22:52