21![Accurate Characteristic Impedance Measurement on Silicon Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boul Accurate Characteristic Impedance Measurement on Silicon Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boul](https://www.pdfsearch.io/img/6dbc73bbae97e588600958cd095e0416.jpg) | Add to Reading ListSource URL: www.nist.govLanguage: English - Date: 2010-07-20 13:22:52
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22![MEASUREMENT Improved Measurement and Analysis Yields Cost-Effective Standby Battery Monitoring Monitoring of standby battery parameters must be comprehensive MEASUREMENT Improved Measurement and Analysis Yields Cost-Effective Standby Battery Monitoring Monitoring of standby battery parameters must be comprehensive](https://www.pdfsearch.io/img/ee6d577e6c3cee67de58019d5929abe1.jpg) | Add to Reading ListSource URL: www.lem.comLanguage: English - Date: 2010-03-18 05:02:41
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23![Characteristic-Impedance Measurement Error on Lossy Substrates Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dyla Characteristic-Impedance Measurement Error on Lossy Substrates Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dyla](https://www.pdfsearch.io/img/e0ba02b0222014c32c8f60429e3c6a6b.jpg) | Add to Reading ListSource URL: www.eeel.nist.govLanguage: English - Date: 2001-07-02 17:51:12
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24![Wideband Frequency-Domain Characterization of High-Impedance Probes Uwe Arz, Howard C. Reader1, Pavel Kabos, Dylan F. Williams National Institute of Standards and Technology 325 Broadway, Boulder, CO 80305, USA Wideband Frequency-Domain Characterization of High-Impedance Probes Uwe Arz, Howard C. Reader1, Pavel Kabos, Dylan F. Williams National Institute of Standards and Technology 325 Broadway, Boulder, CO 80305, USA](https://www.pdfsearch.io/img/036b44e978ba6ecf7e34736be63f7caf.jpg) | Add to Reading ListSource URL: www.eeel.nist.govLanguage: English - Date: 2002-02-13 12:51:24
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25![Comments on “Conversions Between S, Z, Y, h, ABCD, and T Parameters which are Valid for Complex Source and Load Impedances” Dylan F. Williams, IEEE Senior Member and Roger B. Marks, IEEE Senior Member National Instit Comments on “Conversions Between S, Z, Y, h, ABCD, and T Parameters which are Valid for Complex Source and Load Impedances” Dylan F. Williams, IEEE Senior Member and Roger B. Marks, IEEE Senior Member National Instit](https://www.pdfsearch.io/img/dd0e4b8f9813c99e1bc0d2b223f8c338.jpg) | Add to Reading ListSource URL: www.eeel.nist.govLanguage: English - Date: 1998-03-15 16:38:28
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26![Lumped-Element Impedance Standards Dylan F. Williams and David K. Walker National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boulde Lumped-Element Impedance Standards Dylan F. Williams and David K. Walker National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boulde](https://www.pdfsearch.io/img/ad5e067cefe1a3a2b2022d48e1223f54.jpg) | Add to Reading ListSource URL: www.eeel.nist.govLanguage: English - Date: 1998-03-15 16:38:52
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27![Thermal Noise in Lossy Waveguides Dylan F. Williams, Senior Member, IEEE National Institute of Standards and Technology 325 Broadway, Boulder, CO[removed]3138; [removed]FAX) Thermal Noise in Lossy Waveguides Dylan F. Williams, Senior Member, IEEE National Institute of Standards and Technology 325 Broadway, Boulder, CO[removed]3138; [removed]FAX)](https://www.pdfsearch.io/img/e44e0266172f966899c1d4e879af1bfa.jpg) | Add to Reading ListSource URL: www.eeel.nist.govLanguage: English - Date: 1998-03-15 16:38:48
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28![Line-Reflect-Match Calibrations with Nonideal Microstrip Standards1 Dylan F. Williams, Senior Member, IEEE National Institute of Standards and Technology 325 Broadway, Boulder, CO[removed]Jerry B. Schappacher, Member, IEEE Line-Reflect-Match Calibrations with Nonideal Microstrip Standards1 Dylan F. Williams, Senior Member, IEEE National Institute of Standards and Technology 325 Broadway, Boulder, CO[removed]Jerry B. Schappacher, Member, IEEE](https://www.pdfsearch.io/img/79536715d90a31dfd4831aab7aeb588e.jpg) | Add to Reading ListSource URL: www.eeel.nist.govLanguage: English - Date: 1998-03-15 16:38:38
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29![Summary of PTPAC Consensus to Date and Identification of Outstanding Issues Daryll Joyner, Program Adm. Bureau of Watershed Management Phone[removed] Summary of PTPAC Consensus to Date and Identification of Outstanding Issues Daryll Joyner, Program Adm. Bureau of Watershed Management Phone[removed]](https://www.pdfsearch.io/img/d3c075cf5d7a0da96e90da1af724f3fc.jpg) | Add to Reading ListSource URL: www.dep.state.fl.usLanguage: English - Date: 2014-02-25 09:42:21
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30![Accurate Characteristic Impedance Measurement on Silicon Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boul Accurate Characteristic Impedance Measurement on Silicon Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boul](https://www.pdfsearch.io/img/909a95f5bb90e7f6fecf3d9a4c48b73a.jpg) | Add to Reading ListSource URL: www.nist.govLanguage: English - Date: 2010-07-20 13:22:52
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